Identifiability of distributions under competing risks and complementary risks model

Let X₁,X₂,…,X_p be p random variables with cdf's F₁(x),F₂(x),…,F_p(x)respectively. Let U = min(X₁,X₂,…,X_p) and V = max(X₁,X₂,…,X_p).In this paper we study the problem of uniquely determining and estimating the marginal distributions F₁,F₂,…,F_p given the distribution of U or of V.

First the problem of competing and complementary risks are introduced with examples and the corresponding identification problems are considered when the X₁'s are independently distributed and U(V) is identified, as well as the case when U(V) is not identified. The case when the X₁'s are dependent is considered next. Finally the problem of estimation is considered.     

Approximations of the critical region of the fbietkan statistic

The Friedman (1937) test for the randomized complete block design is used to test the hypothesis of no treatment effect among k treatments with b blocks. Difficulty in determination of the size of the critical region for this hypothesis is com¬pounded by the facts that (1) the most recent extension of exact tables for the distribution of the test statistic by Odeh (1977) go up only to the case with k6 and b6, and (2) the usual chi-square approximation is grossly inaccurate for most commonly used combinations of (k,b). The purpose of this paper 2 is to compare two new approximations with the usual x² and F large sample approximations. This work represents an extension to the two-way layout of work done earlier by the authors for the one-way Kruskal-Wallis test statistic.     

Estimation of pr{y<x) for truncation parameter distributions

Blackwell-Rao-Lehmann-Scheffe theory is used to derive the minimum variance ur biased estimator of P=Pr{Y<X} when the independent random variables X and Y follow thf truncation parameter distributions The two-parameter exponential, Pareto, power function and uniform distributions are considered in examples.     

An approximation of the inverse moments of the positive hypergeometric distribution

The negative moments of the positive hyper geometric distribution are often approximated by the inverse of the positive moments of this distribution. In this paper, a suitable approximation to the positive hypergeometric distribution is used to obtain the negative moments.     

A comparison of confidence intervals generated by the scheffé and bonferroni methods

Simultaneous confidence intervals for the p means of a multivariate normal random variable with known variances may be generated by the projection method of Scheffé and by the use of Bonferroni's inequality. It has been conjectured that the Bonferroni intervals are shorter than the Scheffé intervals, at least for the usual confidence levels. This conjecture is proved for all p≥2 and all confidence levels above 50%. It is shown, incidentally, that for all p≥2 Scheffé's intervals are shorter for sufficiently small confidence levels. The results are also applicable to the Bonferroni and Scheffé intervals generated for multinomial proportions.     

Empirical bayes interval estimates involving uniform distributions

Bayesian and empirical Bayesian decision rules are exhibited for the interval estimation of the parameter 0 of a Uniform (0,θ) distribution. The estimate ?,δ>resulting in the interval [?,?+δ]suffers loss given by L(?,δ>,θ)=1-[?≦e≦?+δ]+c₁((?-θ)²+(?+δ?θ)²))+c₂δ. The solution is presented for prior distributions G which have bounded support, no point masses,∫θ^?mdG(θ)<∞ and for some integer m. An example is presented involving a particular parametric form for G and rates of risk convergence in the empirical Bayes problem for this example are calculated.     

A two-stage procedure for selecting the best of k exponential distributions

The problem of selecting the best of k exponential distributions with different guarantee times and the same unknown variance is considered. A two-stage procedure, similar to the one considered by Bechhofer, Dunnett and Sobel (1954), is given. Some specific guidelines for selecting the first-stage sample size are also given.     

On sequentially rejective subset selection procedures

A technique for selection procedures, called sequential rejection, is investigated. It is shown that this technique is posssible to apply to certain selection goals of the "all or nothing" type, i.e. "selecting a subset containing all good populations" or "selecting a subset containing no bad population". The analogy with existing sequential techniques in the general theory of simultaneous statistical inference is pointed out.