Control chart for monitoring multivariate COM-Poisson attributes

Statistical process control of multi-attribute count data has received much attention with modern data-acquisition equipment and online computers. The multivariate Poisson distribution is often used to monitor multivariate attributes count data. However, little work has been done so far on under- or over-dispersed multivariate count data, which is common in many industrial processes, with positive or negative correlation. In this study, a Shewhart-type multivariate control chart is constructed to monitor such kind of data, namely the multivariate COM-Poisson (MCP) chart, based on the MCP distribution. The performance of the MCP chart is evaluated by the average run length in simulation. The proposed chart generalizes some existing multivariate attribute charts as its special cases. A real-life bivariate process and a simulated trivariate Poisson process are used to illustrate the application of the MCP chart.     

Some Comments Regarding the Synthetic Chart

The steady-state average run length (ARL) is a function of the in-control probabilities of being in each nonabsorbing state. Davis and Woodall (2002) tabulated values that are significantly smaller than the steady-state ARLs, because they used the out-of-control probabilities. The synthetic chart signals when a second sample point falls beyond the control limits, no matter whether one of them falls above the centerline and the other falls below it. The side-sensitive version of the synthetic chart does not signal when the points beyond the control limits are on opposite sides. With this rule, the chart detects mean changes more quickly.     

Early warning CUSUM plans for surveillance of negative binomial daily disease counts

Automated public health surveillance of disease counts for rapid outbreak, epidemic or bioterrorism detection using conventional control chart methods can be hampered by over-dispersion and background (‘in-control’) mean counts that vary over time. An adaptive cumulative sum (CUSUM) plan is developed for signalling unusually high incidence in prospectively monitored time series of over-dispersed daily disease counts with a non-homogeneous mean. Negative binomial transitional regression is used to prospectively model background counts and provide ‘one-step-ahead’ forecasts of the next day's count. A CUSUM plan then accumulates departures of observed counts from an offset (reference value) that is dynamically updated using the modelled forecasts. The CUSUM signals whenever the accumulated departures exceed a threshold. The amount of memory of past observations retained by the CUSUM plan is determined by the offset value; a smaller offset retains more memory and is efficient at detecting smaller shifts. Our approach optimises early outbreak detection by dynamically adjusting the offset value. We demonstrate the practical application of the ‘optimal’ CUSUM plans to daily counts of laboratory-notified influenza and Ross River virus diagnoses, with particular emphasis on the steady-state situation (i.e. changes that occur after the CUSUM statistic has run through several in-control counts).     

Minimum aberration blocking schemes for 128-run designs

Several criteria have been proposed for ranking blocked fractional factorial designs. For large fractional factorial designs, the most appropriate minimum aberration criterion was one proposed by Cheng and Wu (2002). We justify this assertion and propose a novel construction method to overcome the computational challenge encountered in large fractional factorial designs. Tables of minimum aberration blocked designs are presented for N=128 runs and n=8–64 factors.     

The influence of parameter estimation on the ARL of Shewhart type charts for time series

In this paper we discuss the behavior of the Shewhart residual chart and the modified Shewhart chart if the parameters of the underlying process are unknown and thus have to be estimated. We focus on the estimation of the variance. For AR models we also consider the estimation of the AR coefficients. The average run length (ARL) of the control chart with estimated parameters is compared with the ARL of the scheme for known parameters and with the ARL for independent variables. Additionally, we give recommendations on the choice of the estimators in the context of Shewhart control schemes.     

Evaluation of control charts under linear trend

The performance of several control charting schemes is studied when the process mean changes as a linear trend. The control charts considered include the Shewhart chart, the Shewhart chart supplemented with runs rules, the cumulative sum (CUSUM) chart, the exponentially weighted moving average (EWMA) chart, and a generalized control chart.     

Improving the performance of the zone control chart

A general model for the zone control chart is presented. Using this model, it is shown that there are score vectors for zone control charts which result in superior average run length performance in comparison to Shewhart charts with common runs rules.

A fast initial response (FIR) feature for the zone control chart is also proposed. Average run lengths of the zone control chart with this feature are calculated. It is shown that the FIR feature improves zone control chart performance by providing significantly earlier signals when the process is out of control.     

Asymptotics of the run lengths of two control charts

The CUSUM control chart proposed by Page is a widely used in monitoring the quality of manufacturing processes. The Shiryayev-Roberts (S-R) control chart due to Shiryayev (1963) and Roberts (1988) is one of its competitors, This paper is concerned with the distribution properties of the run lengths of these two control charts. In context of continuous time, we first give the expansions of the higher moments of these run lengths. Then, we show that the asymptotic distributions of these run lengths are either some exponential distributions, or the distribution of the suprema of a standard Brownian motion, or some normal distributions, according to whether the μ<δ/2,μ =δ/2 and μ>δ/2. Here δ is the reference value of the above charts. Some similar results are also obtained in the context of discrete time.     

A review of statistical process control techniques for short run manufacturing systems

Because manufacturing lot sizes continue to shrink, statistical process control methods for short production runs are increasingly important. We review and comment on the assumptions, advantages and disadvantages of alternatives, Traditional methods well as more recent developments are described and contrasted.