Maximum likelihood estimation of the parameters of a multiple step-stress model from the Birnbaum-Saunders distribution under time-constraint: A comparative study

The cumulative exposure model (CEM) is a commonly used statistical model utilized to analyze data from a step-stress accelerated life testing which is a special class of accelerated life testing (ALT). In practice, researchers conduct ALT to: (1) determine the effects of extreme levels of stress factors (e.g., temperature) on the life distribution, and (2) to gain information on the parameters of the life distribution more rapidly than under normal operating (or environmental) conditions. In literature, researchers assume that the CEM is from well-known distributions, such as the Weibull family. This study, on the other hand, considers a p-step-stress model with q stress factors from the two-parameter Birnbaum-Saunders distribution when there is a time constraint on the duration of the experiment. In this comparison paper, we consider different frameworks to numerically compute the point estimation for the unknown parameters of the CEM using the maximum likelihood theory. Each framework implements at least one optimization method; therefore, numerical examples and extensive Monte Carlo simulations are considered to compare and numerically examine the performance of the considered estimation frameworks.     

Interval estimation for exponential progressive Type-II censored step-stress accelerated life-testing

This paper derives the exact confidence intervals for the exponential step-stress accelerated life-testing model as well as the approximate confidence intervals for the k-step exponential step-stress accelerated life-testing model under progressive Type-II censoring. A Monte Carlo simulation study is carried out to examine the performance of these confidence intervals. Finally, an example is given to illustrate the proposed procedures.     

Inference for step-stress accelerated life tests

In this paper we consider the more realistic aspect of accelerated life testing wherein the stress on an unfailed item is allowed to increase at a preassigned test time. Such tests are known as step-stress tests. Our approach is nonparametric in that we do not make any assumptions about the underlying distribution of life lengths. We introduce a model for step-stress testing which is based on the ideas of shock models and of wear processes. This model unifies and generalizes two previously proposed models for step-stress testing. We propose an estimator for the life distribution under use conditions stress and show that this estimator is strongly consistent.     

Multiple-Steps Step-Stress Accelerated Degradation Modeling Based on Wiener and Gamma Processes

During the step-stress accelerated degradation test (SSADT) experiment, the operator usually elevates the stress level at a predetermined time-point for all tested products that had not failed. This time-point is determined by the experience of the operator and the test is carried on until the performance degradation value of the product crosses the threshold value. In fact, this mode only works when a lot of products have been used in the experiment. But in the SSADT experiment, the number of products is relatively few, and so the test control to the products should be done more carefully. Considering the differences in products, we think the time-point of elevating stress level varies randomly from product-to-product. We consider a situation in which when the degradation value crosses a pre-specified value, the stress level is elevated. Under the circumstances, the time at which the degradation path crosses the pre-specified value is uncertain, and so we may regard it as a random variable. We discuss multiple-steps step-stress accelerated degradation models based on Wiener and gamma processes, respectively, and we apply the Bayesian Markov chain Monte Carlo (MCMC) method for such analytically intractable models to obtain the maximum likelihood estimates (MLEs) efficiently and present some computational results obtained from our implementation.     

Analysis of simple step-stress model in presence of competing risks

ABSTRACT

In this article, we consider a simple step-stress life test in the presence of exponentially distributed competing risks. It is assumed that the stress is changed when a pre-specified number of failures takes place. The data is assumed to be Type-II censored. We obtain the maximum likelihood estimators of the model parameters and the exact conditional distributions of the maximum likelihood estimators. Based on the conditional distribution, approximate confidence intervals (CIs) of unknown parameters have been constructed. Percentile bootstrap CIs of model parameters are also provided. Optimal test plan is addressed. We perform an extensive simulation study to observe the behaviour of the proposed method. The performances are quite satisfactory. Finally we analyse two data sets for illustrative purposes.     

Models Comparison for Step-Stress Accelerated Life Testing

In this article, four basic models for step-stress accelerated life testing are introduced and compared: cumulative exposure model (CEM), linear cumulative exposure model (LCEM), tampered random variable model (TRVM), and tampered failure rate model (TFRM). Limitations of the four models are also introduced for better use of the models.     

Order restricted Bayesian inference for exponential simple step-stress model

A step-stress model has received a considerable amount of attention in recent years. In the usual step-stress experiment, a stress level is allowed to increase at each step to get rapid failure of the experimental units. The expected lifetime of the experimental unit is shortened as the stress level increases. Although extensive amount of work has been done on step-stress models, not enough attention has been paid to analyze step-stress models incorporating this information. We consider a simple step-stress model and provide Bayesian inference of the unknown parameters under cumulative exposure model assumption. It is assumed that the lifetime of the experimental units are exponentially distributed with different scale parameters at different stress levels. It is further assumed that the stress level increases at each step, hence the expected lifetime decreases. We try to incorporate this restriction using the prior assumptions. It is observed that different censoring schemes can be incorporated very easily under a general setup. Monte Carlo simulations have been performed to see the effectiveness of the proposed method, and two datasets have been analyzed for illustrative purposes.     

Exact inference for a simple step-stress model with Type-II hybrid censored data from the exponential distribution

In reliability and life-testing experiments, the researcher is often interested in the effects of extreme or varying stress factors such as temperature, voltage and load on the lifetimes of experimental units. Step-stress test, which is a special class of accelerated life-tests, allows the experimenter to increase the stress levels at fixed times during the experiment in order to obtain information on the parameters of the life distributions more quickly than under normal operating conditions. In this paper, we consider a new step-stress model in which the life-testing experiment gets terminated either at a pre-fixed time (say, _Tm+1$T_{m+1}$) or at a random time ensuring at least a specified number of failures (say, r out of n). Under this model in which the data obtained are Type-II hybrid censored, we consider the case of exponential distribution for the underlying lifetimes. We then derive the maximum likelihood estimators (MLEs) of the parameters assuming a cumulative exposure model with lifetimes being exponentially distributed. The exact distributions of the MLEs of parameters are obtained through the use of conditional moment generating functions. We also derive confidence intervals for the parameters using these exact distributions, asymptotic distributions of the MLEs and the parametric bootstrap methods, and assess their performance through a Monte Carlo simulation study. Finally, we present two examples to illustrate all the methods of inference discussed here.     

On Parameter Inference for Step-Stress Accelerated Life Test with Geometric Distribution

In this article, we present the parameter inference in step-stress accelerated life tests under the tampered failure rate model with geometric distribution. We deal with Type-II censoring scheme involved in experimental data, and provide the maximum likelihood estimate and confidence interval of the parameters of interest. With the help of the Monte-Carlo simulation technique, a comparison of precision of the confidence limits is demonstrated for our method, the Bootstrap method, and the large-sample based procedure. The application of two industrial real datasets shows the proposed method efficiency and feasibility.