Goodness-of-fit tests based on the distance between the Dirichlet process and its base measure

The Dirichlet process is a fundamental tool in studying Bayesian nonparametric inference. The Dirichlet process has several sum representations, where each one of these representations highlights some aspects of this important process. In this paper, we use the sum representations of the Dirichlet process to derive explicit expressions that are used to calculate Kolmogorov, Lévy, and Cramér–von Mises distances between the Dirichlet process and its base measure. The derived expressions of the distance are used to select a proper value for the concentration parameter of the Dirichlet process. These tools are also used in a goodness-of-fit test. Illustrative examples and simulation results are included.     

Bayesian estimation of extropy and goodness of fit tests

Extropy, a complementary dual of entropy, is considered in this paper. A Bayesian approach based on the Dirichlet process is proposed for the estimation of extropy. A goodness of fit test is also developed. Many theoretical properties of the procedure are derived. Several examples are discussed to illustrate the approach.     

On functional central limit theorems of Bayesian nonparametric priors

A general approach to derive the weak convergence, when centered and rescaled, of certain Bayesian nonparametric priors is proposed. This method may be applied to a wide range of processes including, for instance, nondecreasing nonnegative pure jump Lévy processes and normalized nondecreasing nonnegative pure jump Lévy processes with known finite dimensional distributions. Examples clarifying this approach involve the beta process in latent feature models and the Dirichlet process.