A Parameter-Tuned Genetic Algorithm for Economic-Statistical Design of Variable Sampling Interval X-Bar Control Charts for Non-Normal Correlated Samples

Among innovations and improvements that occurred in the past two decades on the techniques and tools used for statistical process control (SPC), adaptive control charts have shown to substantially improve the statistical and/or economical performances. Variable sampling intervals (VSI) control charts are one of the most applied types of the adaptive control charts and have shown to be faster than traditional Shewhart control charts in identifying small changes of concerned quality characteristics. While in the designing procedure of the VSI control charts the data or measurements are assumed independent normal observations, in real situations the validity of these assumptions is under question in many processes. This article develops an economic-statistical design of a VSI X-bar control chart under non-normality and correlation. Since the proposed design consists of a complex nonlinear cost model that cannot be solved using a classical optimization method, a genetic algorithm (GA) is employed to solve it. Moreover, to improve the performances, response surface methodology (RSM) is employed to calibrate GA parameters. The solution procedure, efficiency, and sensitivity analysis of the proposed design are demonstrated through a numerical illustration at the end.     

Monitoring multivariate simple linear profiles using robust estimators

Brief Abstract

This article focuses on estimation of multivariate simple linear profiles. While outliers may hamper the expected performance of the ordinary regression estimators, this study resorts to robust estimators as the remedy of the estimation problem in presence of contaminated observations. More specifically, three robust estimators M, S and MM are employed. Extensive simulation runs show that in the absence of outliers or for small amount of contamination, the robust methods perform as well as the classical least square method, while for medium and large amounts of contamination the proposed estimators perform considerably better than classical method.     

Economic design of VSI X̄ control chart with correlated non-normal data under multiple assignable causes

It has been recently revealed that the Shewhart control charts with variable sampling interval (VSI) perform better than the traditional Shewhart chart with the fixed sampling interval in detecting shifts in the process. In most of these research works, the normality and independency of the process data or measurements are assumed and that the process is subjected to only one assignable cause. While, in practice, these assumptions usually do not hold, some recent studies are focused on working with only one or two of these violations. In this paper, the situation in which the process data are correlated and follow a non-normal distribution and that there is multiplicity of assignable causes in the process is considered. For this case, a cost model for the economic design of the VSI X? control chart is developed, where the Burr distribution is employed to represent the non-normal distribution of the process data. To obtain the optimal values of the design parameters, a genetic algorithm is employed in which the response surface methodology is applied. A numerical example is presented to show the applicability and effectiveness of the proposed methodology. Sensitivity analysis is also carried out to evaluate the effects of cost and input parameters on the performance of the chart.