All pairwise comparisons of exponential location parameters under type i censoring — equal scale parameter case

In this paper, procedures for all pairwise comparisons of location parameters of negative exponential populations are developed when the common scale parameter is known or unknown using large sample distributional approximations of the relevant random variables. The small sample performance of these procedures are then examined using Monte Carlo simulation.     

Exact inference for a simple step-stress model with competing risks for failure from exponential distribution under Type-II censoring

In reliability analysis, accelerated life-testing allows for gradual increment of stress levels on test units during an experiment. In a special class of accelerated life tests known as step-stress tests, the stress levels increase discretely at pre-fixed time points, and this allows the experimenter to obtain information on the parameters of the lifetime distributions more quickly than under normal operating conditions. Moreover, when a test unit fails, there are often more than one fatal cause for the failure, such as mechanical or electrical. In this article, we consider the simple step-stress model under Type-II censoring when the lifetime distributions of the different risk factors are independently exponentially distributed. Under this setup, we derive the maximum likelihood estimators (MLEs) of the unknown mean parameters of the different causes under the assumption of a cumulative exposure model. The exact distributions of the MLEs of the parameters are then derived through the use of conditional moment generating functions. Using these exact distributions as well as the asymptotic distributions and the parametric bootstrap method, we discuss the construction of confidence intervals for the parameters and assess their performance through Monte Carlo simulations. Finally, we illustrate the methods of inference discussed here with an example.     

Inference for a Simple Step-Stress Model with Type-I Censoring and Lognormally Distributed Lifetimes

Accelerated life-testing (ALT) is a very useful technique for examining the reliability of highly reliable products. It allows the experimenter to obtain failure data more quickly at increased stress levels than under normal operating conditions. A step-stress model is one special class of ALT, and in this article we consider a simple step-stress model under the cumulative exposure model with lognormally distributed lifetimes in the presence of Type-I censoring. We then discuss inferential methods for the unknown parameters of the model by the maximum likelihood estimation method. Some numerical methods, such as the Newton–Raphson and quasi-Newton methods, are discussed for solving the corresponding non-linear likelihood equations. Next, we discuss the construction of confidence intervals for the unknown parameters based on (i) the asymptotic normality of the maximum likelihood estimators (MLEs), and (ii) parametric bootstrap resampling technique. A Monte Carlo simulation study is carried out to examine the performance of these methods of inference. Finally, a numerical example is presented in order to illustrate all the methods of inference developed here.     

Exponential progressive step-stress life-testing with link function based on Box–Cox transformation

In order to quickly extract information on the life of a product, accelerated life-tests are usually employed. In this article, we discuss a k-stage step-stress accelerated life-test with M-stress variables when the underlying data are progressively Type-I group censored. The life-testing model assumed is an exponential distribution with a link function that relates the failure rate and the stress variables in a linear way under the Box–Cox transformation, and a cumulative exposure model for modelling the effect of stress changes. The classical maximum likelihood method as well as a fully Bayesian method based on the Markov chain Monte Carlo (MCMC) technique is developed for inference on all the parameters of this model. Numerical examples are presented to illustrate all the methods of inference developed here, and a comparison of the ML and Bayesian methods is also carried out.     

Comparative Study of Blu and ML Estimators of Location and Scale Parameters of an Extreme Value Distribution for Small Samples and Type I Censorship

The Maximum Likelihood (ML) and Best Linear Unbiased (BLU) estimators of the location and scale parameters of an extreme value distribution (Lawless [1982]) are compared under conditions of small sample sizes and Type I censorship. The comparisons were made in terms of the mean square error criterion. According to this criterion, the ML estimator of σ in the case of very small sample sizes (n < 10) and heavy censorship (low censoring time) proved to be more efficient than the corresponding BLU estimator. However, the BLU estimator for σ attains parity with the corresponding ML estimator when the censoring time increases even for sample sizes as low as 10. The BLU estimator of σ attains equivalence with the ML estimator when the sample size increases above 10, particularly when the censoring time is also increased. The situation is reversed when it came to estimating the location parameter μ, as the BLU estimator was found to be consistently more efficient than the ML estimator despite the improved performance of the ML estimator when the sample size increases. However, computational ease and convenience favor the ML estimators.     

WILCOXON-TYPE RANK-SUM PRECEDENCE TESTS

This paper introduces Wilcoxon‐type rank‐sum precedence tests for testing the hypothesis that two life‐time distribution functions are equal. They extend the precedence life‐test first proposed by Nelson in 1963. The paper proposes three Wilcoxon‐type rank‐sum precedence test statistics—the minimal, maximal and expected rank‐sum statistics—and derives their null distributions. Critical values are presented for some combinations of sample sizes, and the exact power function is derived under the Lehmann alternative. The paper examines the power properties of the Wilcoxon‐type rank‐sum precedence tests under a location‐shift alternative through Monte Carlo simulations, and it compares the power of the precedence test, the maximal precedence test and Wilcoxon rank‐sum test (based on complete samples). Two examples are presented for illustration.     

Optimal step-stress test under Type-I censoring for multivariate exponential distribution

In this paper, we study a k-step-stress accelerated life test under Type-I censoring. The lifetime of the items follows the multivariate exponential distribution and a cumulative exposure model is considered. We derive the maximum likelihood estimators of the model parameters and establish the asymptotic properties of them. The problem of choosing the optimal time is addressed by using V-optimality as well as D-optimality criteria. Finally, some numerical studies are discussed to illustrate the proposed procedures.     

Optimal step-stress testing for progressively Type-I censored data from exponential distribution

In this paper, a k  -step-stress accelerated life-testing is considered with an equal step duration τ$\tau$. For small to moderate sample sizes, a practical modification is made to the model previously considered by Gouno et al. [2004. Optimal step-stress test under progressive Type-I censoring. IEEE Trans. Reliability 53, 383–393] in order to guarantee a feasible k  -step-stress test under progressive Type-I censoring, and the optimal τ$\tau$ is determined under this model. Next, we discuss the determination of optimal τ$\tau$ under the condition that the step-stress test proceeds to the k  -th stress level, and the efficiency of this conditional inference is compared to that of the previous case. In all cases considered, censoring is allowed at each point of stress change (viz., iτ$i\tau$, i=1,2,…,k$i=1,2,\dots ,k$). The determination of optimal τ$\tau$ is discussed under C-optimality, D-optimality, and A-optimality criteria. We investigate in detail the case of progressively Type-I right censored data from an exponential distribution with a single stress variable.     

Optimal sample size for record data and associated cost analysis for exponential distribution

Estimation of the mean of an exponential distribution based on record data has been treated by Samaniego and Whitaker [F.J. Samaniego, and L.R. Whitaker, On estimating popular characteristics from record breaking observations I. Parametric results, Naval Res. Logist. Quart. 33 (1986), pp. 531–543] and Doostparast [M. Doostparast, A note on estimation based on record data, Metrika 69 (2009), pp. 69–80]. When a random sample Y ₁, …, Y _n is examined sequentially and successive minimum values are recorded, Samaniego and Whitaker [F.J. Samaniego, and L.R. Whitaker, On estimating popular characteristics from record breaking observations I. Parametric results, Naval Res. Logist. Quart. 33 (1986), pp. 531–543] obtained a maximum likelihood estimator of the mean of the population and showed its convergence in probability. We establish here its convergence in mean square error, which is stronger than the convergence in probability. Next, we discuss the optimal sample size for estimating the mean based on a criterion involving a cost function as well as the Fisher information based on records arising from a random sample. Finally, a comparison between complete data and record is carried out and some special cases are discussed in detail.     

Sequential precedence tests

In this paper we introduce the sequential precedence test (SPT) for testing the equality of two continuous distribution functions, against the stochastically ordered alternative. This procedure replaces the classical precedence test (PT), used in life-testing experiments, by a sequence of tests which are applied at the failure times of one of the samples. This allows the possibility of stopping the experiment earlier than the PT. By means of extensive Monte Carlo simulations and real data, we show that the proposed methodology results in substantial saving of experimental time and cost, without compromising in power. Algorithms for the implementation of the SPT are included.