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PREDICTION FOR EXPONENTIAL LIFETIMES BASED ON STEP-STRESS TESTING
Abstract:ABSTRACT

This paper presents methods for constructing prediction limits for a step-stress model in accelerated life testing. An exponential life distribution with a mean that is a log-linear function of stress, and a cumulative exposure model are assumed. Two prediction problems are discussed. One concerns the prediction of the life at a design stress, and the other concerns the prediction of a future life during the step-stress testing. Both predictions require the knowledge of some model parameters. When estimates for the model parameters are available, a calibration method based on simulations is proposed for correcting the prediction intervals (regions) obtained by treating the parameter estimates as the true parameter values. Finally, a numerical example is given to illustrate the prediction procedure.
Keywords:Accelerated life testing (ALT)  Calibration  Step stress  Exponential distribution  Maximum likelihood estimate (MLE)  Prediction interval (region)  Type I &  II censoring
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