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电成像测井仪器中ADC-BIST测试方法研究及实现
引用本文:赵建武,师奕兵,王志刚. 电成像测井仪器中ADC-BIST测试方法研究及实现[J]. 电子科技大学学报(社会科学版), 2010, 0(5)
作者姓名:赵建武  师奕兵  王志刚
作者单位:电子科技大学自动化工程学院;
基金项目:国家863计划(2006AA06Z222); 中国教育部新世纪优秀人才支持计划(NCET-05-0804)
摘    要:模拟/数字转换器(ADC)是构成混合信号电路系统的基本器件。针对ADC测试中存在的问题,该文提出了一种新颖的使用斜坡信号作为测试激励的ADC内建自测试输出分析方法,相对于直方图分析方法,具有更短的测试时间,并且硬件资源开销较小。该方法除了可以测试ADC的差分非线性和积分非线性等静态参数,还可检测ADC的漏码特性。该文给出了两种完整的ADC内建自测试实现结构,可用于不同配置的混合信号电路系统。实验结果证明了所提出方法的有效性。

关 键 词:模拟电路  模拟数字转换  内建自测试  可测性设计  

ADC-BIST Testing Method in Electrical Imaging Well Logging Tools
ZHAO Jian-wu,SHI Yi-bing,, WANG Zhi-gang. ADC-BIST Testing Method in Electrical Imaging Well Logging Tools[J]. Journal of University of Electronic Science and Technology of China(Social Sciences Edition), 2010, 0(5)
Authors:ZHAO Jian-wu  SHI Yi-bing     WANG Zhi-gang
Affiliation:ZHAO Jian-wu,SHI Yi-bing,, WANG Zhi-gang (School of Automation Engineering,University of Electronic Science , Technology of China Chengdu 610054)
Abstract:A built-in self-test(BIST) scheme for analog to digital converters is proposed based on a linear ramp signal and efficient output analysis.The proposed analysis method is an alternative to histogram-based analysis techniques to provide test time improvements,especially when the resources are scarce.In addition to the measurement of DNL and INL,non-monotonic behavior can also be detected with the proposed technique.Two implementation options are presented based on how much on-chip resources are available.Exp...
Keywords:analog circuits  analog to digital conversion  built-in self test  design for testability  
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