Detecting and identifying interventions with the Whittle spectral approach in a long memory panel data model

This article provides a procedure for the detection and identification of outliers in the spectral domain where the Whittle maximum likelihood estimator of the panel data model proposed by Chen W.D. Chen, Testing for spurious regression in a panel data model with the individual number and time length growing, J. Appl. Stat. 33(88) (2006b), pp. 759–772] is implemented. We extend the approach of Chang and co-workers I. Chang, G.C. Tiao, and C. Chen, Estimation of time series parameters in the presence of outliers, Technometrics 30 (2) (1988), pp. 193–204] to the spectral domain and through the Whittle approach we can quickly detect and identify the type of outliers. A fixed effects panel data model is used, in which the remainder disturbance is assumed to be a fractional autoregressive integrated moving-average (ARFIMA) process and the likelihood ratio criterion is obtained directly through the modified inverse Fourier transform. This saves much time, especially when the estimated model implements a huge data-set.

Through Monte Carlo experiments, the consistency of the estimator is examined by growing the individual number N and time length T, in which the long memory remainder disturbances are contaminated with two types of outliers: additive outlier and innovation outlier. From the power tests, we see that the estimators are quite successful and powerful.

In the empirical study, we apply the model on Taiwan's computer motherboard industry. Weekly data from 1 January 2000 to 31 October 2006 of nine familiar companies are used. The proposed model has a smaller mean square error and shows more distinctive aggressive properties than the raw data model does.