A fast wavelet approach for recovering damaged images |
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Authors: | Donghoh Kim Youngjo Lee |
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Institution: | 1. Department of Applied Mathematics , Sejong University , Seoul , Korea;2. Department of Statistics , Seoul National University , Seoul , Korea |
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Abstract: | A wavelet method is proposed for recovering damaged images. The proposed method combines wavelet shrinkage with preprocessing based on a binning process and an imputation procedure that is designed to extend the scope of wavelet shrinkage to data with missing values and perturbed locations. The proposed algorithm, termed as the BTW algorithm is simple to implement and efficient for recovering an image. Furthermore, this algorithm can be easily applied to wavelet regression for one-dimensional (1-D) signal estimation with irregularly spaced data. Simulation studies and real examples show that the proposed method can produce substantially effective results. |
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Keywords: | binning process imputation missing pixel perturbed location scattered data wavelet shrinkage |
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