Goodness-of-fit tests for exponentiality based on a loss-of-memory type functional equation

Three goodness-of-fit tests for exponentiality based on the functional equation characterization 1?F(2x)=1?F(x)]² for every x?0 are proposed and shown to compare well to several popular tests against common alternative cdf's. Small-sample critical values for α=0.10,0.05 are developed for the two superior test statistics and the asymptotic null-distributions are characterized.