首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Sequential maximum likelihood estimation for reflected Ornstein-Uhlenbeck processes
Authors:Chihoon Lee  Jaya PN Bishwal
Institution:a Department of Statistics, Colorado State University, Fort Collins, CO 80523, United States
b Department of Mathematics and Statistics, University of North Carolina at Charlotte, Charlotte, NC 28223, United States
Abstract:The paper studies the properties of a sequential maximum likelihood estimator of the drift parameter in a one dimensional reflected Ornstein-Uhlenbeck process. We observe the process until the observed Fisher information reaches a specified precision level. We derive the explicit formulas for the sequential estimator and its mean squared error. The estimator is shown to be unbiased and uniformly normally distributed. A simulation study is conducted to assess the performance of the estimator compared with the ordinary maximum likelihood estimator.
Keywords:Reflected Ornstein-Uhlenbeck processes  Sequential maximum likelihood estimator  Unbiasedness  Mean squared error  Efficiency
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号