Local power of panel unit root tests allowing for structural breaks |
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Authors: | Yiannis Karavias Elias Tzavalis |
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Affiliation: | 1. School of Economics and Granger Centre for Time Series Econometrics, University of Nottingham, University Park, Nottingham, UK;2. Department of Economics, Athens University of Economics and Business, Athens, Greece |
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Abstract: | The asymptotic local power of least squares–based fixed-T panel unit root tests allowing for a structural break in their individual effects and/or incidental trends of the AR(1) panel data model is studied. Limiting distributions of these tests are derived under a sequence of local alternatives, and analytic expressions show how their means and variances are functions of the break date and the time dimension of the panel. The considered tests have nontrivial local power in a N?1/2 neighborhood of unity when the panel data model includes individual intercepts. For panel data models with incidental trends, the power of the tests becomes trivial in this neighborhood. However, this problem does not always appear if the tests allow for serial correlation in the error term and completely vanishes in the presence of cross-section correlation. These results show that fixed-T tests have very different theoretical properties than their large-T counterparts. Monte Carlo experiments demonstrate the usefulness of the asymptotic theory in small samples. |
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Keywords: | Bias correction cross-section correlation fixed T incidental trends Strong factors |
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