| 低温下微波单晶材料电参数的快速测量 |
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| 引用本文： | 唐宗熙,罗正祥,张其劭. 低温下微波单晶材料电参数的快速测量[J]. 电子科技大学学报(社会科学版), 1994, 0(4) |
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| 作者姓名： | 唐宗熙 罗正祥 张其劭 |
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| 作者单位： | 电子科技大学微波测试中心 |
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| 摘 要： | 对谐振腔微扰法测试单晶电介质微波复介电常数进行了分析。采用研制的ＴＥ＿（１０ｎ）。模矩形谐振腔，利用标量网络分析系统与微机联网，在液氮温度和常温下对电介质材料进行了实测，结果表明：该测试技术可对常用微波介质材料在不同温度（如液氮、液氦及常温）下进行测试，且测试简便、迅速、自动化程度高，并且有测试材料某一方向复介电常数的优点。
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| 关 键 词： | 微扰法，谐振腔，单晶电介质，复介电常数，测量 |
A RAPID MEASUREMENT OF DIELECTRIC PARAMETERS OF MICROWAVE SINGLE CRYSTAL MATERIALS AT LOWT TEMPERATURE |
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| Tang Zongxi, Luo Zhengxiang, Zhang Qishao. A RAPID MEASUREMENT OF DIELECTRIC PARAMETERS OF MICROWAVE SINGLE CRYSTAL MATERIALS AT LOWT TEMPERATURE[J]. Journal of University of Electronic Science and Technology of China(Social Sciences Edition), 1994, 0(4) |
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| Authors: | Tang Zongxi Luo Zhengxiang Zhang Qishao |
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| Abstract: | A cavity porturbation method is analysed for determination of complexpermittivity of microwave single crystal dielectric materials. The some exporiments are madewith the TE_(10m) mode rectangular cavity and an automatic scalar network analysing system atLN_2 and room temperature; The results prove that the technique covers measurement of gener- al microwave dielectric materials at different temperature (ex.LN_2, LHe_2 and room tempera-ture). The test is simple, rapid and automatic, and some directional complex permittivity of dielectric materials can be measured. |
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| Keywords: | perturbation method cavity single crystal dielectric materials complexpermittivity measurement |
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