Abstract: | Simultaneous confidence bands provide a useful adjunct to the popular Kaplan–Meier product limit estimator for a survival function, particularly when results are displayed graphically. They allow an assessment of the magnitude of sampling errors and provide a graphical view of a formal goodness-of-fit test. In this paper we evaluate a modified version of Nair's (1981) simultaneous confidence bands. The modification is based on a logistic transformation of the Kaplan–Meier estimator. We show that the modified bands have some important practical advantages. |