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Residual analysis and outliers in loglinear models based on phi-divergence statistics
Authors:A.K. Gupta  T. NguyenL. Pardo
Affiliation:Deparment of Mathematics and Statistics, Bowling Green State University, Bowling Green, OH 43403, USA
Abstract:In this paper we consider new families of residuals and influential measures, under the assumption of multinomial sampling, for loglinear models. These new families are based on φφ-divergence test statistic. The asymptotic normality of the standardized residuals is obtained as well as the relation of the new family of influential measures with the appropriate Cook's distance in this context. The expression of the new family of residuals is obtained in two important problems: independence and symmetry in two-dimensional contingence tables. A numerical example illustrates the results obtained.
Keywords:Primary, 62H15   secondary, 62H17
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