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Development of r,T hybrid sampling plans for exponential lifetime distributions
Authors:Hyean-Seok Jeong  Jong-In Park  Bong-Jin Yum
Abstract:SUMMARY In the original hybrid reliability acceptance sampling plan RASP developed by Epstein for the exponential lifetime distribution, the sample size n and the number of failures r to be observed are determined given the truncation time T . However, these plans cannot be used when test items are expensive and or limited in number. Therefore, one wishes to have a plan in which n is given. In this paper, we develop hybrid RASPs in which r and T are determined, given n. These plans are tabulated for various combinations of parameter values, so that one may easily determine an appropriate plan.
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