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On D-optimal robust designs for lifetime improvement experiments
Authors:Rabindra Nath Das
Institution:a Department of Statistics, The University of Burdwan, Burdwan, W.B., India
b School of Statistics, Renmin University, Beijing, China
c Department of Statistics, Pennsylvania State University, University Park, PA 16802, USA
Abstract:Locating the optimal operating conditions of the process parameters is critical in a lifetime improvement experiment. For log-normal lifetime distribution with compound error structure (i.e., symmetry, inter-class and intra-class correlation error structures), we have developed methods for construction of D-optimal robust first order designs. It is shown that D-optimal robust first order designs are always robust first order rotatable but the converse is not always true.
Keywords:Compound symmetry structure  D-optimal robust design  Mean life  Response surface  Robust rotatability
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