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A CLASS OF NONPARAMETRIC TESTS FOR THE ONE-SAMPLE LOCATION PROBLEM
Authors:KL Mehra    NGN Prasad  KS Madhava  Rao
Institution:The University of Alberta;Dept. of Statistics &Applied Probability, The University of Alberta, Edmonton, Alberta, Canada, T6G 2G1;On leave from M.G.M. College, UDUPI (D.K.), India, 576012
Abstract:A class of “optimal”U-statistics type nonparametric test statistics is proposed for the one-sample location problem by considering a kernel depending on a constant a and all possible (distinct) subsamples of size two from a sample of n independent and identically distributed observations. The “optimal” choice of a is determined by the underlying distribution. The proposed class includes the Sign and the modified Wilcoxon signed-rank statistics as special cases. It is shown that any “optimal” member of the class performs better in terms of Pitman efficiency relative to the Sign and Wilcoxon-signed rank statistics. The effect of deviation of chosen a from the “optimal” a on Pitman efficiency is also examined. A Hodges-Lehmann type point estimator of the location parameter corresponding to the proposed “optimal” test-statistics is also defined and studied in this paper.
Keywords:Asymptotic relative efficiency  nonparametric tests  optimal test  Sign test  Wilcoxon-signed rank test  sensitivity analysis
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