Accelerated Degradation Models for Failure Based on Geometric Brownian Motion and Gamma Processes |
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Authors: | Email author" target="_blank">Chanseok?ParkEmail author W?J?Padgett |
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Institution: | (1) Department of Mathematical Sciences, Clemson University, Clemson, SC 29634, USA;(2) Department of Statistics, University of South Carolina, Columbia, SC 29208, USA |
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Abstract: | Based on a generalized cumulative damage approach with a stochastic process describing degradation, new accelerated life test models are presented in which both observed failures and degradation measures can be considered
for parametric inference of system lifetime. Incorporating an accelerated test variable, we provide several new accelerated
degradation models for failure based on the geometric Brownian motion or gamma process. It is shown that in most cases, our
models for failure can be approximated closely by accelerated test versions of Birnbaum–Saunders and inverse Gaussian distributions.
Estimation of model parameters and a model selection procedure are discussed, and two illustrative examples using real data
for carbon-film resistors and fatigue crack size are presented. |
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Keywords: | inverse Gaussian (Wald) distribution degradation process accelerated life test geometric Brownian motion process gamma process censoring |
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