The Sensitivity of Detrended Long-Memory Processes

Long-memory tests are often complicated by the presence of deterministic trends. Hence, an additional step of detrending the data is necessary. The typical way to detrend a suspected long-memory series is to use OLS or BSP residuals. Applying the method of sensitivity analysis we address the of question of how robust these residuals are in presence of potential long memory components. Unlike short-memory ARMA process long-memory I(d) processes causes sensitivity to OLS/BSP residuals. Therefore, we develop a finite sample measure of the sensitivity of a detrended series based on the residuals. Based on our sensitivity measure we propose a “rule of thumb” for practitioners to choose between the two methods of detrending, has been provided in this article.