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Confidence intervals for the kappa parameter,with application to the semiconductor industry |
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| Authors: | Rachelle C Wilkinson G Bruce Schaalje Bruce Jay Collings |
| Institution: | Department of Statistics , Brigham Young University , 84602, Provo, UT, 230 TMCB |
| Abstract: | |
| Keywords: | kappa statistic measures of agreement for categorical data bootstrap bias-corrected bootstrap square root transformation |