Empirical bayes tests in a positive exponential family with partial information on priors |
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Authors: | Tachen Liang |
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Institution: | Department of Mathematics , Wayne State University , Detroit, MI, 48202 |
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Abstract: | We investigate an empirical Bayes testing problem in a positive exponential family having pdf f{x/θ)=c(θ)u(x) exp(?x/θ), x>0, θ>0. It is assumed that θ is in some known compact interval C1, C2]. The value C1 is used in the construction of the proposed empirical Bayes test δ* n. The asymptotic optimality and rate of convergence of its associated Bayes risk is studied. It is shown that under the assumption that θ is in C1, C2] δ* n is asymptotically optimal at a rate of convergence of order O(n?1/n n). Also, δ* n is robust in the sense that δ* n still possesses the asymptotic optimality even the assumption that "C1≦θ≦C2 may not hold. |
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Keywords: | asymptotically optimal rate of convergence |
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