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Multiple Sampling Inspection Plans for Attributes
Authors:V Soundararajan  V Kuralmani
Institution:Department of Statistics , Bharathiar University , 641 046 , Coimbatore , Tamil Nadu , India
Abstract:A set of tables is presented enabling one to design multiple (Group sequential) sampling plans when various entry parameters are given. Table yielding item by item sequential sampling plans indexed by (AQL, AOQL) is also presented.
Keywords:Multiple sampling plan  Acceptable quality level  Limiting quality level  Average outgoing quality limit  Indifference quality level  Relative slope  Inflection point  Sequential sampling plan
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