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Simultaneous Testing for the Successive Differences of Exponential Location Parameters
Authors:Parminder Singh  Asheber Abebe  Satya N Mishra
Institution:1. Department of Mathematics , Guru Nanak Dev University , Amritsar , India singhparm@gmail.com;3. Department of Mathematics and Statistics , Auburn University , Alabama , USA;4. Department of Mathematics and Statistics , University of South Alabama , Mobile , Alabama , USA
Abstract:
Keywords:Contrasts  Critical constants  Numerical integration  Pairwise comparisons  Simultaneous confidence intervals
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