Time truncated attribute control chart for the Weibull distribution using multiple dependent state sampling

In this article, an attribute control chart is proposed for time truncated tests using the Weibull distribution. The design of proposed control chart is presented using the multiple dependent state (MDS) sampling. The control chart coefficients are determined for various specified average run length. The efficiency of the proposed control chart is elaborated with the help of a simulation data and a real data. The proposed control chart perform better than the existing control chart in terms of average run length.