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Bayesian process monitoring schemes for the two-parameter exponential distribution
Authors:R. van Zyl  A. J. van der Merwe
Affiliation:Department of Mathematical Statistics and Actuarial Sciences, University of the Free State, Free State, Bloemfontein, South Africa
Abstract:In this paper a Bayesian procedure is applied to obtain control limits for the location and scale parameters, as well as for a one-sided upper tolerance limit in the case of the two-parameter exponential distribution. An advantage of the upper tolerance limit is that it monitors the location and scale parameter at the same time. By using Jeffreys’ non-informative prior, the predictive distributions of future maximum likelihood estimators of the location and scale parameters are derived analytically. The predictive distributions are used to determine the distribution of the “run-length” and expected “run-length”. A dataset given in Krishnamoorthy and Mathew (2009 Krishnamoorthy, K., and T. Mathew. 2009. Statistical Tolerance Regions: Theory, Applications and Computation. Wiley Series in Probability and Statistics.[Crossref] [Google Scholar]) are used for illustrative purposes. The data are the mileages for some military personnel carriers that failed in service. The paper illustrates the flexibility and unique features of the Bayesian simulation method.
Keywords:Bayesian procedure  Control chart  Jeffrey’s prior  Run-length  Two-parameter exponential distribution
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