| 窄线宽半导体激光器谱宽测试技术研究 |
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| 引用本文： | 黎海涛,杨亚培,邓兴成.窄线宽半导体激光器谱宽测试技术研究[J].电子科技大学学报(社会科学版),1998(5). |
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| 作者姓名： | 黎海涛 杨亚培 邓兴成 |
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| 作者单位： | 电子科技大学电子技术系 |
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| 摘 要： | 提出一种新颖的窄线宽半导体激光器测试技术—延迟光纤干涉法。利用部分相干光理论推出延迟光纤干涉的计算公式，通过模拟计算，总结出采用这种技术的测试方法，建立了实验系统，对实验结果进行数据分析，证明了这种新的测试技术方案是正确可行的。
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| 关 键 词： | 光纤 干涉 窄线宽 半导体激光器 |
Research of Linewidth Measurement of Narrow Linewidth Semiconductor Laser |
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| Li Haitao,Yang Yapei,Deng Xingcheng.Research of Linewidth Measurement of Narrow Linewidth Semiconductor Laser[J].Journal of University of Electronic Science and Technology of China(Social Sciences Edition),1998(5). |
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| Authors: | Li Haitao Yang Yapei Deng Xingcheng |
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| Abstract: | By analyzing the delayed self heterodyne method and investigating partial coherent theory, a novel technique delayed optical fiber interferometer is proposed This paper also deduces the formula describing the measurement of spectral linewidth of semiconductor laser width delayed optical fiber interferometer, which is demonstrated by simultaneous computation and experimental results |
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| Keywords: | measurement opticalfiber interferometer narrow linewidth semiconductor laser |
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