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Statistical inference through AFT model for biotechnical systems
Authors:Vincent Couallier  Laurent Denis  Vilijandas Bagdonavi?ius  Mikhail Nikulin  Léo Gerville-Réache
Institution:1. IMB UMR CNRS 5251, University Victor Segalen Bordeaux, 2 Bordeaux, France;2. StatXpert Company, Bordeaux, France;3. University of Vilnius, Vilnius, Lithuania
Abstract:The objective of this paper is to model the phenomenon of degradation-to-failure for assemblies used for lumbar arthrodesis, starting from the analysis of their structure/geometry, the load applied and the kind of failure when several occur. An AFT model is proposed to model the joint effects of the applied load and the structural dimensions of the brand (namely length and diameter of the screw, presence of a connector or not) on the failure time due to a screw failure. The estimations of SN curves and maximum permissible load (named critical load) values are provided as functions of the structural dimensions of the product. This allows comparisons of devices in terms of key factors determining product behavior and ageing under loading stress.
Keywords:Accelerated life testing  Weibull distribution  Maximum likelihood estimation  SNP curves  Critical load  Fatigue limit
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