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Detecting the Guttman effect with the help of ordinal correspondence analysis in synchrotron X-ray diffraction data analysis |
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| Authors: | C. Manté ,S. Cornu,D. Borschneck,C. Mocuta,R. van den Bogaert |
| Affiliation: | aUniversité du Sud Toulon-Var, CNRS/INSU,IRD, Aix-Marseille Université, Marseille, France;bCNRS, IRD, INRA, Coll France, CEREGE, Aix Marseille Université, Aix-en-Provence, France;cSynchrotron SOLEIL, L''Orme des Merisiers, Saint-Aubin, Gif-sur-Yvette, France |
| Abstract: | |
| Keywords: | Ordinal correspondence analysis detrended correspondence analysis randomization eigenvalues orthogonal polynomials synchrotron X-rays diffraction |