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Bayesian unit-root tests for Stochastic Volatility models
Authors:Zeynep I Kalayl?o?lu  Sujit K Ghosh
Institution:1. Department of Statistics, Middle East Technical University, Ankara, Turkey;2. Department of Statistics, North Carolina State University, Raleigh, NC 27695-8203, USA
Abstract:In this article, we consider Bayesian inference procedures to test for a unit root in Stochastic Volatility (SV) models. Unit-root tests for the persistence parameter of the SV models, based on the Bayes Factor (BF), have been recently introduced in the literature. In contrast, we propose a flexible class of priors that is non-informative over the entire support of the persistence parameter (including the non-stationarity region). In addition, we show that our model fitting procedure is computationally efficient (using the software WinBUGS). Finally, we show that our proposed test procedures have good frequentist properties in terms of achieving high statistical power, while maintaining low total error rates. We illustrate the above features of our method by extensive simulation studies, followed by an application to a real data set on exchange rates.
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