Optimal component test plans for a parallel system based on Type-II censoring

Consider a parallel system with n independent components. Assume that the lifetime of the jth component follows an exponential distribution with a constant but unknown parameter λ_j, 1≤j≤n. We test r_j components of type-j for failure and compute the total time T_j of r_j failures for the jth component. Based on T=(T₁,T₂,…,T_n) and r=(r₁,r₂,…,r_n), we derive optimal reliability test plans which ensure the usual probability requirements on system reliability. Further, we solve the associated nonlinear integer programming problem by a simple enumeration of integers over the feasible range. An algorithm is developed to obtain integer solutions with minimum cost. Finally, some examples have been discussed for various levels of producer’s and consumer’s risk to illustrate the approach. Our optimal plans lead to considerable savings in costs over the available plans in the literature.