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Constructing non-regular robust parameter designs
Institution:1. University of British Columbia, Vancouver, BC, Canada V6T 1Z2;2. Department of Statistics and Actuarial Science, Simon Fraser University, Burnaby, BC, Canada V5A 1S6;1. Faculty of Mathematics and Statistics, Central China Normal University, Wuhan 430079, China;2. Department of Mathematics, Faculty of Science, Zagazig University, Zagazig 44519, Egypt;1. Faculty of Mathematics and Statistics, Central China Normal University, Wuhan 430079, China;2. Department of Mathematics, Faculty of Science, Zagazig University, Zagazig 44519, Egypt;1. Department of Applied Mathematics and Institute of Statistics, National Chung Hsing University, Taichung, 40227, Taiwan;2. Department of Statistics, University of Manitoba, Winnipeg, MB R3T 2N2, Canada;1. Department of Statistics, Central China Normal University, Wuhan 430079, China;2. Department of Mathematics, Faculty of Science, Zagazig University, Zagazig, Egypt
Abstract:In recent years there has been considerable attention paid to robust parameter design as a strategy for variance reduction. Of particular concern is the selection of a good experimental plan in light of the two different types of factors in the experiment (control and noise) and the asymmetric manner in which effects of the same order are treated. Recent work has focussed on the selection of regular fractional factorial designs in this setting. In this article, we consider the construction and selection of optimal non-regular experiment plans for robust parameter design. Our approach defines the word-length pattern for non-regular fractional factorial designs with two different types of factors which allows for the choice of optimal design to emphasize the estimation of the effects of interest. We use this new word-length pattern to rank non-regular robust parameter designs. We show that one can easily find minimum aberration robust parameter designs from existing orthogonal arrays. The methodology is demonstrated by finding optimal assignments for control and noise factors for 12, 16 and 20-run orthogonal arrays.
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