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Symmetric -charts: Sensitivity to nonnormality and control-limit estimation |
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| Authors: | Huifen Chen David Goldsman Bruce W Schmeiser Kwok-Leung Tsui |
| Institution: | 1. Department of Industrial and Systems Engineering, Chung-Yuan University, Chung-Li, Taiwan;2. H. Milton Stewart School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, Georgia, USA;3. School of Industrial Engineering, Purdue University, West Lafayette, Indiana, USA;4. Department of Systems Engineering and Engineering Management, City University of Hong Kong, Kowloon, Hong Kong |
| Abstract: | |
| Keywords: | Average run length Control limits Johnson family Kurtosis Skewness |