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热打印头的失效机理与寿命分析
引用本文:张生才,申云琴,姚素英.热打印头的失效机理与寿命分析[J].电子科技大学学报(社会科学版),2001(2).
作者姓名:张生才  申云琴  姚素英
作者单位:天津大学电子信息工程学院!天津 300072,天津大学电子信息工程学院!天津 300072,天津大学电子信息工程学院!天津 300072
摘    要:在对热印头进行高温存储实验、震动实验、脉冲加热实验和实际打印实验的基础上,总结出热印头失效的五种模式,并分析了各种模式的失效原因;论述了提高热印头寿命的措施。

关 键 词:薄膜热印头  热打印机  失效机理  寿命

Degradation Causes and Life Estimation of Thermal Printing Heads
Zhang Shengcai,Shen Yunqin,Yao Suying.Degradation Causes and Life Estimation of Thermal Printing Heads[J].Journal of University of Electronic Science and Technology of China(Social Sciences Edition),2001(2).
Authors:Zhang Shengcai  Shen Yunqin  Yao Suying
Abstract:Long lifetime is a base for thermal printing heads to be applied widely. Experiments on these thermal printing heads include high temperature storage tests, shaking tests, pulse-heat tests, and actual thermal printing tests. From the experiments, five degradation modes of thermal printing heads are summarized. The degradation reasons for the five modes are analyzed and the means of increasing the lifetime of thermal printing heads are demonstrated.
Keywords:thin film thermal printing head  thermal printers  degradation causes  lifetime
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