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Application of decreasing integrated hazard in Rahim and Banerjee model on economic design of -control charts for systems with increasing failure rate and early replacement
Authors:M. A. Pasha  Y. Khadem
Affiliation:Department of Statistics, Allameh Tabataba’i University, Beheshti-Ghasir Ave., Tehran, Iran
Abstract:
Keywords:Economic design (ED)  Economic statistical design (ESD)  Increasing failure rate (IFR)  Integrated hazard over sampling interval (IHI)  Process failure mechanism (PFM).
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