Coincidence of two failure rate models |
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| Authors: | Seiji Nabeya |
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| Affiliation: | Tokyo International University , 1-13-1, Matobakita, Kawagoe, Saitama, 350, Japan |
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| Abstract: | In considering an accelerated life test model, Bhattacharyya and Soejoeti (1989) proposed the tampered failure rate (TFR) model, and they gave a necessary and sufficient condition for the model to coincide with the tampered random variable (TRV) model due to DeGroot and Goel (1979). The main purpose of this paper is to show that their claim on the necessity is not true, in a stronger sense than theirs. |
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| Keywords: | accelerated life test failure rate model |
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