Development of life-test sampling plans for exponential distributions based on accelerated life testing |
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| Authors: | Bong-Jin Yum Sun-Ho Kim |
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| Institution: | 1. Department of Industrial Engineering , Korea Advanced Institute of Science and Technology , P.O.Box 150 Chongryang, Seoul, Korea;2. Agency for Defence Development , Korea |
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| Abstract: | This paper presents a procedure for developing life-test sampling plans for exponential distributions based upon accelerated life testing(ALT). Type II censoring is assumed at each overstress level. The derived test statistic is shown to be a quotient of two independent random variables, each of which is a rational power of a Chi-square random variable. The distribution of the test statistic is characterized by the H-function, which can be numerically evaluated to obtain desired sampling plans. |
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| Keywords: | Type II censoring H-function distribution |
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