Likelihood ratio test for testing equality of location parameters of two exponential distributions from doubly censored samples |
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Authors: | B N Shetty P C Joshi |
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Institution: | 1. National Informatics Centre , A-Block, CGO Complex, New Delhi-3, India;2. Department of Mathematics , IIT , Kanpur, India |
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Abstract: | The Likelihood Ratio (LR) test for testing equality of two exponential distributions with common unknown scale parameter is obtained. Samples are assumed to be drawn under a type II doubly censored sampling scheme. Effects of left and right censoring on the power of the test are studied. Further, the performance of the LR test is compared with the Tiku(1981) test. |
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Keywords: | order statistics power function simulated critical values two parameter exponential distributions |
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