首页 | 本学科首页   官方微博 | 高级检索  
     


Locally optimal test for simultaneously testing the mean and variance of a normal distribution
Authors:Ashis Sen Gupta  Lea Vermeire
Affiliation:1. Statistics &2. Applied Probability Program , University of California , Calcutta - INDIA, Santa Barbara, CA, 93106, USAIndian Statistical Institute;3. Department of Mathematics , Catholic University of Leuven , Campus Kortrijk, Kortrijk, B8500, Belgium
Abstract:A generalization of the locally most powerful unbiased (LMPU) test for the single parameter case to the k-parameter case was proposed by SenGupta and Vermeire (1986). In particular we defined a locally most mean power unbiased (LMMPU) test based on the mean curvature of the power hypersurface. Compared to the type C tests of Neyman and Pearson and the type D tests (Isaacson, 1951), LMMPU tests possess better theoretical properties and enjoy ease of construction of critical regions. In this paper we present an interesting example of a two-parameter univariate normal population for which Isaacson (1951, p. 233) was unsuccessful in finding a type D test. For the case of one observation, we prove that no Type D region exists but the LMMPU test is obtained - it is an example of a test with singular Hessian matrix for its power but is nevertheless a strictly locally unbiased (LU) test.
Keywords:Locally most mean power unbiased tests  mean curvature
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号