Tests for exponentiality |
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| Authors: | Girish Patwardhan |
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| Institution: | Department of Mathematics , The Penn State Uriverslty at AItoona. , altoona, Pa, 16601 |
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| Abstract: | The idea of measuring the departure of data bu a plot of obeserved observations against their expectation has been expeetations has been exploited in this paper to develop tests for exponentiality the tests are for parameter two parameter exponential distribution with complete sample and one parameter exponential distribution with complete sample and one large sample distributions of the test statistics critical points have been computed for different levels of significance and applications of these have been computed for differents levels of significance and applications of these tests have been discussed in case of three data sets. |
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| Keywords: | exponential distribution ordered statistic pearson family of distribution generalized inverse censored data |
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