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Weibull accelerated life tests when there are competing causes of failure
Authors:John P Klein  Asit P Basu
Institution:Department of Statistics , The Ohio State University , Columbus, 43210, Ohio
Abstract:Accelerated life testing of a product under more severe than normal conditions is commonly used to reduce test time and costs. Data collected at such accelerated conditions are used to obtain estimates of the parameters of a stress translation function. This function is then used to make inference about the product's life under normal operating conditions. We consider the problem of accelerated life tests when the product of interest is a p component series system. Each of the components is assumed to have an independent Weibull time to failure distribution with different shape parameters and different scale parameters which are increasing functions stress. A general model i s used for the scale parameter includes the standard engineering models as special This model also has an appealing biological interpretation
Keywords:safe dose levels  competing risks  accelerated lifetests  Hartley and Sielkin model
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