Weibull accelerated life tests when there are competing causes of failure |
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Authors: | John P. Klein Asit P. Basu |
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Affiliation: | Department of Statistics , The Ohio State University , Columbus, 43210, Ohio |
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Abstract: | Accelerated life testing of a product under more severe than normal conditions is commonly used to reduce test time and costs. Data collected at such accelerated conditions are used to obtain estimates of the parameters of a stress translation function. This function is then used to make inference about the product's life under normal operating conditions. We consider the problem of accelerated life tests when the product of interest is a p component series system. Each of the components is assumed to have an independent Weibull time to failure distribution with different shape parameters and different scale parameters which are increasing functions stress. A general model i s used for the scale parameter includes the standard engineering models as special This model also has an appealing biological interpretation |
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Keywords: | safe dose levels competing risks accelerated lifetests Hartley and Sielkin model |
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