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Uniformity in factorial designs with mixed levels
Affiliation:1. Chern Institute of Mathematics and LPMC, Nankai University Tianjin 300071, PR China;2. College of Science, Civil Aviation University of China Tianjin 300300, PR China;1. College of Electrical and Information Engineering, Hunan University, Changsha 410082, China;2. State Key Laboratory of Synthetical Automation for Process Industries, Northeastern University, Shenyang 110004, China
Abstract:The uniformity can be utilized as a measure for comparing factorial designs. Fang and Mukerjee (Biometrika 87 (2000) 193–198) and Fang et al. (in: K.T. Fang, F.J. Hickernell, H. Niederreiter (Eds.), Monte Carlo and Quasi-Monte Carlo Methods 2000, Springer, Berlin, 2002) found links among uniformity in terms of some non-uniformity measures, orthogonality and aberration for regular symmetric factorials. In this paper we extend their results to asymmetric factorials by considering a so-called wrap-around L2-discrepancy to evaluate the uniformity of factorials. Furthermore, a lower bound of wrap-around L2-discrepancy is obtained for asymmetric factorials and two new ways of construction of factorial designs with mixed levels are proposed.
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