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Tests for the skewness parameter of two-piece double exponential distribution in the presence of nuisance parameters
Authors:Leela Subramanian  Vaijayanti U Dixit
Institution:1. Department of Statistics, University of Mumbai, Mumbai, India;2. SIES College of Arts, Science and Commerce, Mumbai, India;3. SIES College of Arts, Science and Commerce, Mumbai, India
Abstract:In this paper, tests for the skewness parameter of the two-piece double exponential distribution are derived when the location parameter is unknown. Classical tests like Neyman structure test and likelihood ratio test (LRT), that are generally used to test hypotheses in the presence of nuisance parameters, are not feasible for this distribution since the exact distributions of the test statistics become very complicated. As an alternative, we identify a set of statistics that are ancillary for the location parameter. When the scale parameter is known, Neyman–Pearson's lemma is used, and when the scale parameter is unknown, the LRT is applied to the joint density function of ancillary statistics, in order to obtain a test for the skewness parameter of the distribution. Test for symmetry of the distribution can be deduced as a special case. It is found that power of the proposed tests for symmetry is only marginally less than the power of corresponding classical optimum tests when the location parameter is known, especially for moderate and large sample sizes.
Keywords:Ancillary statistic  asymmetric Laplace distribution  likelihood ratio test  Neyman–Pearson's lemma  two-piece distribution
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