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Influence diagnostics and outlier tests for semiparametric mixed models
Authors:Wing-Kam Fung  Zhong-Yi Zhu  Bo-Cheng Wei  Xuming He
Institution:University of Hong Kong, People's Republic of ChinaEast China Normal University, Shanghai, People's Republic of ChinaSoutheast University, Nanjing, People's Republic of China and University of Illinois at Urbana—Champaign, USA
Abstract:Summary. Semiparametric mixed models are useful in biometric and econometric applications, especially for longitudinal data. Maximum penalized likelihood estimators (MPLEs) have been shown to work well by Zhang and co-workers for both linear coefficients and nonparametric functions. This paper considers the role of influence diagnostics in the MPLE by extending the case deletion and subject deletion analysis of linear models to accommodate the inclusion of a nonparametric component. We focus on influence measures for the fixed effects and provide formulae that are analogous to those for simpler models and readily computable with the MPLE algorithm. We also establish an equivalence between the case or subject deletion model and a mean shift outlier model from which we derive tests for outliers. The influence diagnostics proposed are illustrated through a longitudinal hormone study on progesterone and a simulated example.
Keywords:Cook's distance  Longitudinal data  Penalized likelihood  Repeated measure  Semiparametric regression  Smoothing spline
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