Statistical analysis of process capability indices with measurement errors: The case ofC
p |
| |
Authors: | Silvano Bordignon Michele Scagliarini |
| |
Institution: | (1) Dipartimento di Scienze Statistiche, Via C. Battisti 241/243, 35121 Padova, Italy;(2) Dipartimento di Scienze Statistiche Via Belle Arti 41, 40126 Bologna, Italy |
| |
Abstract: | Process capability indices (PCIs) have been widely used in manufacturing industries to previde a quantitative measure of process
potential and performance. While some efforts have been dedicated in the literature to the statistical properties of PCIs
estimators, scarce attention has been given to the evaluation of these properties when sample data are affected by measurement
errors. In this work we deal with the problem of measurement errors effects on the performance of PCIs. The analysis is illustrated
with reference toC
p
, i.e. the simplest and most common measure suggested to evaluate process capability.
The authors would like to thank two anonymous referees for their comments and suggestion that were useful in the preparation
and improvement of this paper. This work was partially supported by a MURST research grant. |
| |
Keywords: | Process capability indices measurement errors C p estimation |
本文献已被 SpringerLink 等数据库收录! |